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Type | Conference or Workshop Paper |
Scope | Discipline-based scholarship |
Published in Proceedings | Yes |
Title | Discovering patterns of change types |
Organization Unit | |
Authors |
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Editors |
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Presentation Type | paper |
Item Subtype | Original Work |
Refereed | Yes |
Status | Published in final form |
Language |
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ISBN | 978-1-4244-2187-9 |
ISSN | 1527-1366 |
Page Range | 463 - 466 |
Event Title | 23rd IEEE/ACM International Conference on Automated Software Engineering (ASE 2008) |
Event Type | conference |
Event Location | L'Aquila, Italy |
Event Start Date | September 15 - 2008 |
Event End Date | September 19 - 2008 |
Place of Publication | Los Alamitos |
Publisher | IEEE Computer Society |
Abstract Text | The reasons why software is changed are manyfold; new features are added, bugs have to be fixed, or the consistency of coding rules has to be re-established. Since there are many types of of source code changes we want to explore whether they appear frequently together in time and whether they describe specific development activities. We describe a semi-automated approach to discover patterns of such change types using agglomerative hierarchical clustering. We extracted source code changes of one commercial and two open-source software systems and applied the clustering. We found that change type patterns do describe development activities and affect the control flow, the exception flow, or change the API. |
Related URLs | |
Digital Object Identifier | 10.1109/ASE.2008.74 |
Other Identification Number | merlin-id:281 |
PDF File | Download from ZORA |
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Additional Information | This paper was presented at the 23rd International Conference on Automated Software Engineering (ASE 2008), L'Aquila, Italy, September 15 - 19, 2008. © 2008 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. |