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Contribution Details

Type Journal Article
Scope Discipline-based scholarship
Title Modeling and simulations of the cascading failure of multiple interdependent R&D networks under risk propagation
Organization Unit
Authors
  • Hui Liu
  • Naiding Yang
  • Zhao Yang
  • Yanlu Zhang
  • Jianhong Lin
Item Subtype Original Work
Refereed Yes
Status Published in final form
Language
  • English
Journal Title Physics Letters A
Publisher Elsevier
Geographical Reach international
ISSN 0375-9601
Volume 383
Number 21
Page Range 2443 - 2450
Date 2019
Abstract Text In this paper, we study the robustness of multiple interrelated R&D networks under risk propagation. Firstly, using a bi-partite graph to represent the interrelated R&D networks is emphasized and proposed. Secondly, a risk propagation model is built by defining risk load and risk capacity of each enterprise on a specific R&D network, Thirdly, we use simulations to study risk propagation in interrelated R&D networks. Our results indicate that there exist three critical thresholds to quantify the robustness of R&D networks. Risk propagation in R&D networks is highly affected by the heterogeneity of all enterprises' scales and risk capacities.
Digital Object Identifier 10.1016/j.physleta.2019.05.012
Other Identification Number merlin-id:18632
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