@article{publication-18717,
	author={Grano, Giovanni and Laaber, Christoph and Panichella, Annibale and Panichella, Sebastiano},
	doi={10.1109/TSE.2019.2946773},
	issn={0098-5589},
	journal={IEEE Transactions on Pattern Analysis and Machine Intelligence},
	number=11,
	pages={2332-2347},
	publisher={Institute of Electrical and Electronics Engineers},
	title={Testing with Fewer Resources: An Adaptive Approach to Performance-Aware Test Case Generation},
	volume=47,
	year=2021,
}